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產(chǎn)品(pǐn)中(zhōng)心您當前的(dí)位置:首頁 > 產品中心(xīn) > DESCO/KLEINWACHTER靜電(diàn)測試(shì) > 重錘表麵靜(jìng)電(diàn)電阻(zǔ)/電阻(zǔ)率(shuài) > Charge Decay Analyser靜電衰(shuāi)減分析儀

基(jī)礎(chǔ)信息(xī)Product information

產品(pǐn)名稱:Charge Decay Analyser靜(jìng)電衰(shuāi)減分析儀(yí)

產品型號(hào):

更新時間(jiān):2025-06-09

產品簡介:

Charge Decay Analyser靜電衰減分析儀(yí),JCI-155靜電衰減儀可對(duì)固體,粉體和液(yè)體材(cái)料(liào)進行監測

產(chǎn)品特性Product characteristics

JCI155v6  Charge Decay Analyser靜電(diàn)衰減分析儀(yí)
Electrostatic Charge Decay Time Analyser JCI-155v6
JCI-155 靜電衰減分(fēn)析儀(yí)由英國Chilworth公(gōng)司開發(fā)製造. Chilworth是的爆(bào)炸/燃燒危害檢測(cè)機(jī)構(gòu), 同(tóng)時(shí)也是相關(guān)專(zhuān)業儀器和(hé)設(shè)備的製造商. JCI-155 靜(jìng)電(diàn)衰減(jiǎn)分析(xī)儀經歷(lì)了(liǎo)3代(dài)的(dí)發展過(guò)程, 從zui初(chū)的155v4 到155v5, 型(xíng)號為155v6.
JCI-155靜(jìng)電衰減(jiǎn)儀可(kě)對固體,粉體和液(yè)體材料進行監測, 軟(ruǎn)件功(gōng)能*, 是美(měi)國國(guó)家航(háng)空和(hé)宇宙航(háng)行(háng)局(NASA)采用產品(pǐn). 同(tóng)時JCI-155v6衰減分(fēn)析儀還是(shì)IEC 61340-2-1標(biāo)準(zhǔn)規(guī)範(fàn)的模(mó)板(bǎn)設備(bèi).
JCI 155v6用於(yú)測試(shì)材料(liào)的靜電衰減(jiǎn)時間和(hé)電容(róng)負載
可(kě)直接將JCI 155v6 放置在測試材(cái)料上測量
測(cè)量(liáng)範圍: 10毫(háo)秒-99小(xiǎo)時
測試反應(yīng)時間: 10毫(háo)秒
測(cè)試電(diàn)壓(yā)(電暈放電(diàn)): 0-9.9kV(可(kě)以選(xuǎn)擇正(zhèng)負(fù)極性)
衰減(jiǎn)測試(shì)比例: 1%-99%的衰減時間
同時測量環境溫濕(shī)度
特別設計(jì)氣(qì)閘效(xiào)應, 消除(chú)殘留空氣離子(zǐ)幹擾(rǎo)
高精度靜電(diàn)壓測試(shì)探頭
采用配套JCI176樣品台可測(cè)量(liáng)轉移到測試料樣(yàng)上的電量, 並(bìng)計算出(chū)電(diàn)容負(fù)載
采(cǎi)用(yòng)配套JCI173樣品(pǐn)杯可以測(cè)量(liáng)粉(fěn)體和(hé)液體的靜(jìng)電(diàn)衰(shuāi)減期
配套JCI-Graph軟(ruǎn)件在(zài)電腦中(zhōng)儲(chǔ)存分析數據,衰減曲綫(xiàn)和形成報告


品牌(pái): JCI
製(zhì)造商(shāng): Chilworth Technology Ltd
產(chǎn)地: 英(yīng)國(guó)
訂購編號(hào):     描(miáo)述:
JCI155v6     包(bāo)含以下物品(pǐn)
      測試(shì)儀
      JCI176樣品台(tái), 用(yòng)於(yú)測試(shì)平麵(miàn)材(cái)料(liào), 可(kě)以(yǐ)測(cè)試(shì)材(cái)料(liào)電荷(hé)負載(zǎi)
      JCI173樣(yàng)品杯, 用於測(cè)試粉體(tǐ)和液體
      測試(shì)儀(yí)和(hé)樣(yàng)品台連接纜(lǎn)綫, 1條(tiáo)
      接地(dì)綫(xiàn), 2條
      長(cháng)USB數據綫(xiàn), 1條, 用於(yú)連接(jiē)儀器(qì)和(hé)電腦(nǎo)
      短USB數據綫, 1條(tiáo), 用於外(wài)接(jiē)U盤
      配(pèi)套軟件(jiàn)
      校正(zhèng)書(shū)和(hé)說明書

 

JCI155v6  Charge Decay Analyser靜(jìng)電(diàn)衰減分析儀

Two  years  in  development,  JCI  Chilworth  is  proud  to announce  the next  generation of our highly successful electrostatic charge decay analyser, the  JCI  155v6.  A  comprehensive  advance  on  previous  generations of electrostatic decay analyser, we believe this new monitor outperforms all others on the market today.          
            JCI 155v6 - ADVANCES IN USABILITY 
 •    User friendly interface with simple setup of run  parameters and comparative presentation of results  
•     Live, on-instrument display of test results (v5 does not display graphs)  
•    Calculation and display of capacitance loading on the instrument (v5 only via JCI Graph) 
•     Enhanced LCD display with dimmable back light (v5 simple alphanumeric) 
•     Download and display of test descriptions to instrument  (v5 description visible in JCI Graph only) 
•    1024 samples per second rate (v5 = 512 per second) with higher resolution to improve accuracy of results 
  •     Software updates downloadable from the Web 
  •    Driverless USB interface to PC (v5 = serial RS232) 
     •    High resolution 19 bit sampling 

•     Battery life of over 8 hours  (v5 around 4 hours)  
•    Full charge time of 2 hours (v5 4 hours) 
•    Lower power mode, auto power-down and multiple 
run auto-termination options  

NEW JCI 155v6 DESIGN PRINCIPLES 
The JCI 155 charge decay analyser is a sophisticated instrument and the 
culmination of incremental developments carried-out over many years by 
Dr John Chubb and continued by JCI Chilworth. It is designed to achieve 
full functionality independent of a host PC yet can uplink to a PC for test 
data and instrument control. 
Intuitive and portable, the v6t charges in half the time of the v5 (just 2 
hours) and yet has double the battery endurance (8 hours) with the op-tion  to  power  from  mains  supply  also.  The  new  analyser  provides  a 
unique, all-in-one package capable of measuring charge decay times for 
materials as a key indicator of such static problems as: 
 
 JCI155v6  主要參(cān)數(shù) 
電暈放電電(diàn)壓(yā):0-9900V(默(mò)認(rèn)設(shè)置7000V) 
電(diàn)暈(yùn)放電時(shí)間:0-50ms,以(yǐ)2ms增幅設(shè)置(默(mò)認(rèn)設(shè)置20ms) 
初始電(diàn)壓(yā)取值時間:0-100ms,以10ms增幅(fú)設置(zhì)(默認(rèn)設置20ms) 
測試(shì)結束(shù)點:可(kě)以選(xuǎn)擇以(yǐ)下4種(zhǒng) 
低(dī)於+/-2V自動結(jié)束(shù)測試 
到達1/e 和設(shè)置(zhì)的衰(shuāi)減百分(fēn)比(可(kě)設置1%-99%),默(mò)認(rèn)設(shè)置10% 
開(kāi)始測(cè)試後(hòu)1-99h(按(àn)1h增幅(fú)設置) 
手動停止測試(shì) 
滑板開啟並(bìng)移(yí)動(dòng)速度:20ms(快),0.75s(慢(màn)) 
 
 
采(cǎi)用JCI-176樣品(pǐn)台可以測(cè)量電容(róng)負載(相(xiāng)對(duì)電容) 
測(cè)試固體(tǐ)材(cái)料(liào)時,把被測(cè)試(shì)材(cái)料(liào)加入JCI-176樣品(pǐn)台(tái) 
測(cè)試(shì)粉體(tǐ),液(yè)體材料時,把JCI-173樣品(pǐn)杯夾入(rù)JCI-176樣品(pǐn)台(tái) 
The JCI 155v6 is also invaluable for Quality Assurance testing where 
materials  are  intended  to  address  or  control  possible  electrostatic     
problems.  Especially  useful  is  the  ability  to  place  the  unit  onto  the      
surface  to  be  tested.  Using  the  JCI  176  charge  measuring  sample   
support base (included), and other accessories, ensures a wide range 
of  materials  including  textiles,  rubbers,  paper,  plastics,  powders  or       
liquids can be tested to name but a few. 
       material flow issues 
             surface contamination 
 personnel shocks   quality control 
   equipment damage    ignitions   
explosions      low-productivity  

Technology at work for you 
Many  of  the  useful  opportunities    
presented  by  static  electricity,  and 
many of its risks and problems, relate 
to the influence of retained electrostatic charge manifested 
as surface voltage. In the JCI 155v6 Charge Decay Test 
Analyser,  a  high  voltage  corona  discharge  is  used  to       
deposit a patch of charge onto the surface of the material 
to be tested. A fast response electrostatic field-meter then 
measures  the  voltage  generated  by  this  charge  and       
assesses its decay characteristics. 
THE LATEST JCI 155V6 
CHARGE DECAY     
ANALYSER 
 live graphs, 
          user-friendly operation 
A FUSION OF TECHNOLOGY 
Technologies involved in this new-generation analyser include 
the  latest  in  electromechanical  field-mills  giving  highly          
accurate,  sensitive  and  stable  measurement  of  surface        
potential. The JCI 155v6 can operate standalone or can be 
linked to PC providing a fast, flexible and intuitive interface for 
accurate measurements.  
DATA SECURITY 
  
  The JCI 155v6 also offers levels of  data security to provide a 
secure  and  flexible  return  on  your  investment,  whilst  helping 
build your quality and accountability levels 

JCI Chilworth 
Beta House 
Southampton Science  Park 
Chilworth 
Southampton 
United Kingdom 
SO16 7NS 
In  addition,  you  can  request  full 
technical specifications, or contact 
a JCI specialist using the contact 
details on the right. 
We  are  also  running  a  series  of 
online  Webex  launch  events  at  a 
date and time to suit you, contact 
us today for an online invitation. 
JCI Chilworth’s experts are always 
on-hand to answer your 155v6 
questions, or discuss our wider 
range of solutions for electrostatic     
measurement and control. 
ELECTROSTATIC  
PROBLEMS? 
  For details of Chilworth’s 
broad range of further    
electrostatic equipment and 
consultancy, see over.. 
     we look       
forward to being 
of assistance 
As  a  current  or  new  user  of  the  new  
JCI  155v6,  we  are  confident  that  you 
will want to know more about its capa-bilities  and  features  so  have  prepared 
an  exclusive  launch  video  and         
‘step-through’ demonstration of the new         
analyser  on  our  JCI  155v6  dedicated            
microsite, details below - 

Chilworth Global brings together 
leading expert consultants in the field 
of process safety with GLP compliant 
laboratories providing a single point 
of contact for all your process safety 
needs.  
Chilworth’s laboratories determine 
electrostatic  and flammability data 
for materials and undertake chemical 
reaction hazard and regulatory test-ing. Our Consultant Engineers pro-vide expertise in all aspects of elec-trostatics (applications, problems and 
hazards), fire and explosion safety 
and chemical reaction hazards. For 
further information on all our products 
 
JCI Chilworth is our brand name for  
a well established range of electro-static instruments, of which three are          
mentioned below:  
The JCI178 measures small quantities 
of charge and charge transfer in           
electrostatic discharges  
The JCI140 Static Monitor is a hand-held proximity voltmeter used in many 
industries and by electrostatic         
professionals. 
The JCI131 is an electric field meter 
suitable for use in adverse conditions, 
including long-term monitoring        
outdoors.   
We also offer a range of optional ac-cessories, consultancy and calibration 
services which enhance and expand  
this most comprehensive and excep-tional range of quality instrumentation. 

 

JCI155v6  性能(néng)優(yōu)點
JCI-155v6靜(jìng)電分析儀是IEC 61340-2-1規(guī)範所(suǒ)采用(yòng)的(dí)*設(shè)備 
JCI-155v6靜電分析(xī)儀式是(shì)美(měi)國國家(jiā)航空和(hé)宇宙航行(háng)局(NASA)采用(yòng)產(chǎn)品 
 
JCI-155v6是一款(kuǎn)小(xiǎo)巧輕便的(dí)測試儀器(qì),采用電暈放電(diàn)方式(shì)施加(jiā)電荷到被測材料表麵,可以快速,精(jīng)確地測量(liáng)材(cái)料的(dí)靜電消(xiāo)散(sàn)能力和(hé)評(píng)估(gū)一(yī)定(dìng)數(shù)量(liáng)的(dí)電荷(hé)轉移到材(cái)料上時,是(shì)否(fǒu)會產生(shēng)明顯的(dí)靜(jìng)電(diàn)位。 
 
JCI-155v6主要(yào)由電(diàn)壓計,電暈放電裝置(zhì),計時器,機(jī)械運(yùn)動結構,內(nèi)部處理器和(hé)儲(chǔ)存器構成。高壓電暈放(fàng)電(diàn)施(shī)加(jiā)電荷到(dào)測(cè)試料(liào)樣(yàng)表麵,電壓計(jì)對表麵電壓進(jìn)行測量,計時器(qì)對過(guò)程計時(shí),所有過(guò)程由內部處(chǔ)理器控製及處(chǔ)理(lǐ)數據(jù)。 
 
所有(yǒu)的操(cāo)作和數(shù)據(jù)處(chǔ)理都由(yóu)JCI-155v6的(dí)處理器和軟件(jiàn)完(wán)成(chéng),通過(guò)5個多(duō)功能(néng)按(àn)鍵來進行人機(jī)交(jiāo)互(hù)。測試測試數據保存(cún)在儀(yí)器內(nèi)存(cún)中,可以(yǐ)通過USB接口輸出(chū)到(dào)個人電腦。 
 
儀器(qì)本(běn)身大屏(píng)幕LCD可以(yǐ)顯示(shì)測(cè)試(shì)讀數(shù)和曲(qū)綫(xiàn)圖。采用(yòng)USB連接綫(xiàn)連接(jiē)個人(rén)電腦(nǎo)後(hòu),通過(guò)配套JCI-Graph軟件可以在電腦端控製(zhì)儀器,設置(zhì)測試(shì)參數。所(suǒ)有數(shù)據可以(yǐ)輸出(chū)到(dào)電腦並(bìng)保(bǎo)存(cún)為(wéi)表單(dān)文(wén)件(jiàn),測試數(shù)據和(hé)圖形可以(yǐ)直接(jiē)打印,復製(zhì)粘貼到(dào)其他(tā)應用程(chéng)序(例(lì)如WORD)。 
 
配(pèi)套(tào)JCI-176樣品(pǐn)台提(tí)供一個標準的測試平台,可(kě)以方便地(dì)固(gù)定(dìng)被測(cè)材(cái)料。JCI-176還可以測(cè)試(shì)材料所(suǒ)獲得的電荷量(liáng),進(jìn)而(ér)計算電容負(fù)載。在JCI-176樣品台的基礎上(shàng)加上(shàng)JCI-173樣(yàng)品(pǐn)杯可以(yǐ)測試(shì)粉體和(hé)液(yè)體(tǐ)。 
 
JCI-155v6采用(yòng)特(tè)殊(shū)結構(gòu),不(bù)同於傳(chuán)統(tǒng)的(dí)靜(jìng)電(diàn)衰減監測儀。傳統的(dí)靜電(diàn)衰(shuāi)減監(jiān)測(cè)儀(yí)要(yào)求把被測(cè)試材料(liào)按規(guī)定(dìng)尺(chǐ)寸切割後放(fàng)置(zhì)在一(yī)個(gè)旋轉的(dí)接地(dì)平台(tái)上(shàng),被測(cè)試材料(liào)周(zhōu)期性(xìng)的經過,電(diàn)壓探(tàn)頭下(xià)方,以此(cǐ)來(lái)周(zhōu)期性的獲取信號來(lái)計(jì)算衰(shuāi)減特(tè)性。 
 
JCI-155v6采(cǎi)用旋(xuán)轉葉片式電壓(yā)探(tàn)頭,這(zhè)樣可(kě)以直接(jiē)周(zhōu)期性(xìng)的獲取(qǔ)信號,被測試料樣不用(yòng)特殊(shū)處理(lǐ),也不(bù)需要(yào)運(yùn)動(dòng)。因此(cǐ)JCI-155v6的整體結構(gòu)更(gēng)加緊密輕(qīng)巧,可(kě)以(yǐ)直接放置在被測材料上(shàng)進行測試。 

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