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產品(pǐn)名稱:Charge Decay Analyser靜(jìng)電衰(shuāi)減分析儀(yí)
產品型號(hào):
更新時間(jiān):2025-06-09
產品簡介:
Charge Decay Analyser靜電衰減分析儀(yí),JCI-155靜電衰減儀可對(duì)固體,粉體和液(yè)體材(cái)料(liào)進行監測
JCI155v6 Charge Decay Analyser靜電(diàn)衰減分析儀(yí)
Electrostatic Charge Decay Time Analyser JCI-155v6
JCI-155 靜電衰減分(fēn)析儀(yí)由英國Chilworth公(gōng)司開發(fā)製造. Chilworth是的爆(bào)炸/燃燒危害檢測(cè)機(jī)構(gòu), 同(tóng)時(shí)也是相關(guān)專(zhuān)業儀器和(hé)設(shè)備的製造商. JCI-155 靜(jìng)電(diàn)衰減(jiǎn)分析(xī)儀經歷(lì)了(liǎo)3代(dài)的(dí)發展過(guò)程, 從zui初(chū)的155v4 到155v5, 型(xíng)號為155v6.
JCI-155靜(jìng)電衰減(jiǎn)儀可(kě)對固體,粉體和液(yè)體材料進行監測, 軟(ruǎn)件功(gōng)能*, 是美(měi)國國(guó)家航(háng)空和(hé)宇宙航(háng)行(háng)局(NASA)采用產品(pǐn). 同(tóng)時JCI-155v6衰減分(fēn)析儀還是(shì)IEC 61340-2-1標(biāo)準(zhǔn)規(guī)範(fàn)的模(mó)板(bǎn)設備(bèi).
JCI 155v6用於(yú)測試(shì)材料(liào)的靜電衰減(jiǎn)時間和(hé)電容(róng)負載
可(kě)直接將JCI 155v6 放置在測試材(cái)料上測量
測(cè)量(liáng)範圍: 10毫(háo)秒-99小(xiǎo)時
測試反應(yīng)時間: 10毫(háo)秒
測(cè)試電(diàn)壓(yā)(電暈放電(diàn)): 0-9.9kV(可(kě)以選(xuǎn)擇正(zhèng)負(fù)極性)
衰減(jiǎn)測試(shì)比例: 1%-99%的衰減時間
同時測量環境溫濕(shī)度
特別設計(jì)氣(qì)閘效(xiào)應, 消除(chú)殘留空氣離子(zǐ)幹擾(rǎo)
高精度靜電(diàn)壓測試(shì)探頭
采用配套JCI176樣品台可測(cè)量(liáng)轉移到測試料樣(yàng)上的電量, 並(bìng)計算出(chū)電(diàn)容負(fù)載
采(cǎi)用(yòng)配套JCI173樣品(pǐn)杯可以測(cè)量(liáng)粉(fěn)體和(hé)液體的靜(jìng)電(diàn)衰(shuāi)減期
配套JCI-Graph軟(ruǎn)件在(zài)電腦中(zhōng)儲(chǔ)存分析數據,衰減曲綫(xiàn)和形成報告
品牌(pái): JCI
製(zhì)造商(shāng): Chilworth Technology Ltd
產(chǎn)地: 英(yīng)國(guó)
訂購編號(hào): 描(miáo)述:
JCI155v6 包(bāo)含以下物品(pǐn)
測試(shì)儀
JCI176樣品台(tái), 用(yòng)於(yú)測試(shì)平麵(miàn)材(cái)料(liào), 可(kě)以(yǐ)測(cè)試(shì)材(cái)料(liào)電荷(hé)負載(zǎi)
JCI173樣(yàng)品杯, 用於測(cè)試粉體(tǐ)和液體
測試(shì)儀(yí)和(hé)樣(yàng)品台連接纜(lǎn)綫, 1條(tiáo)
接地(dì)綫(xiàn), 2條
長(cháng)USB數據綫(xiàn), 1條, 用於(yú)連接(jiē)儀器(qì)和(hé)電腦(nǎo)
短USB數據綫, 1條(tiáo), 用於外(wài)接(jiē)U盤
配(pèi)套軟件(jiàn)
校正(zhèng)書(shū)和(hé)說明書
JCI155v6 Charge Decay Analyser靜(jìng)電(diàn)衰減分析儀
Two years in development, JCI Chilworth is proud to announce the next generation of our highly successful electrostatic charge decay analyser, the JCI 155v6. A comprehensive advance on previous generations of electrostatic decay analyser, we believe this new monitor outperforms all others on the market today.
JCI 155v6 - ADVANCES IN USABILITY
• User friendly interface with simple setup of run parameters and comparative presentation of results
• Live, on-instrument display of test results (v5 does not display graphs)
• Calculation and display of capacitance loading on the instrument (v5 only via JCI Graph)
• Enhanced LCD display with dimmable back light (v5 simple alphanumeric)
• Download and display of test descriptions to instrument (v5 description visible in JCI Graph only)
• 1024 samples per second rate (v5 = 512 per second) with higher resolution to improve accuracy of results
• Software updates downloadable from the Web
• Driverless USB interface to PC (v5 = serial RS232)
• High resolution 19 bit sampling
• Battery life of over 8 hours (v5 around 4 hours)
• Full charge time of 2 hours (v5 4 hours)
• Lower power mode, auto power-down and multiple
run auto-termination options
NEW JCI 155v6 DESIGN PRINCIPLES
The JCI 155 charge decay analyser is a sophisticated instrument and the
culmination of incremental developments carried-out over many years by
Dr John Chubb and continued by JCI Chilworth. It is designed to achieve
full functionality independent of a host PC yet can uplink to a PC for test
data and instrument control.
Intuitive and portable, the v6t charges in half the time of the v5 (just 2
hours) and yet has double the battery endurance (8 hours) with the op-tion to power from mains supply also. The new analyser provides a
unique, all-in-one package capable of measuring charge decay times for
materials as a key indicator of such static problems as:
JCI155v6 主要參(cān)數(shù)
電暈放電電(diàn)壓(yā):0-9900V(默(mò)認(rèn)設(shè)置7000V)
電(diàn)暈(yùn)放電時(shí)間:0-50ms,以(yǐ)2ms增幅設(shè)置(默(mò)認(rèn)設(shè)置20ms)
初始電(diàn)壓(yā)取值時間:0-100ms,以10ms增幅(fú)設置(zhì)(默認(rèn)設置20ms)
測試(shì)結束(shù)點:可(kě)以選(xuǎn)擇以(yǐ)下4種(zhǒng)
低(dī)於+/-2V自動結(jié)束(shù)測試
到達1/e 和設(shè)置(zhì)的衰(shuāi)減百分(fēn)比(可(kě)設置1%-99%),默(mò)認(rèn)設(shè)置10%
開(kāi)始測(cè)試後(hòu)1-99h(按(àn)1h增幅(fú)設置)
手動停止測試(shì)
滑板開啟並(bìng)移(yí)動(dòng)速度:20ms(快),0.75s(慢(màn))
采(cǎi)用JCI-176樣品(pǐn)台可以測(cè)量電容(róng)負載(相(xiāng)對(duì)電容)
測(cè)試固體(tǐ)材(cái)料(liào)時,把被測(cè)試(shì)材(cái)料(liào)加入JCI-176樣品(pǐn)台(tái)
測(cè)試(shì)粉體(tǐ),液(yè)體材料時,把JCI-173樣品(pǐn)杯夾入(rù)JCI-176樣品(pǐn)台(tái)
The JCI 155v6 is also invaluable for Quality Assurance testing where
materials are intended to address or control possible electrostatic
problems. Especially useful is the ability to place the unit onto the
surface to be tested. Using the JCI 176 charge measuring sample
support base (included), and other accessories, ensures a wide range
of materials including textiles, rubbers, paper, plastics, powders or
liquids can be tested to name but a few.
material flow issues
surface contamination
personnel shocks quality control
equipment damage ignitions
explosions low-productivity
Technology at work for you
Many of the useful opportunities
presented by static electricity, and
many of its risks and problems, relate
to the influence of retained electrostatic charge manifested
as surface voltage. In the JCI 155v6 Charge Decay Test
Analyser, a high voltage corona discharge is used to
deposit a patch of charge onto the surface of the material
to be tested. A fast response electrostatic field-meter then
measures the voltage generated by this charge and
assesses its decay characteristics.
THE LATEST JCI 155V6
CHARGE DECAY
ANALYSER
live graphs,
user-friendly operation
A FUSION OF TECHNOLOGY
Technologies involved in this new-generation analyser include
the latest in electromechanical field-mills giving highly
accurate, sensitive and stable measurement of surface
potential. The JCI 155v6 can operate standalone or can be
linked to PC providing a fast, flexible and intuitive interface for
accurate measurements.
DATA SECURITY
The JCI 155v6 also offers levels of data security to provide a
secure and flexible return on your investment, whilst helping
build your quality and accountability levels
JCI Chilworth
Beta House
Southampton Science Park
Chilworth
Southampton
United Kingdom
SO16 7NS
In addition, you can request full
technical specifications, or contact
a JCI specialist using the contact
details on the right.
We are also running a series of
online Webex launch events at a
date and time to suit you, contact
us today for an online invitation.
JCI Chilworth’s experts are always
on-hand to answer your 155v6
questions, or discuss our wider
range of solutions for electrostatic
measurement and control.
ELECTROSTATIC
PROBLEMS?
For details of Chilworth’s
broad range of further
electrostatic equipment and
consultancy, see over..
we look
forward to being
of assistance
As a current or new user of the new
JCI 155v6, we are confident that you
will want to know more about its capa-bilities and features so have prepared
an exclusive launch video and
‘step-through’ demonstration of the new
analyser on our JCI 155v6 dedicated
microsite, details below -
Chilworth Global brings together
leading expert consultants in the field
of process safety with GLP compliant
laboratories providing a single point
of contact for all your process safety
needs.
Chilworth’s laboratories determine
electrostatic and flammability data
for materials and undertake chemical
reaction hazard and regulatory test-ing. Our Consultant Engineers pro-vide expertise in all aspects of elec-trostatics (applications, problems and
hazards), fire and explosion safety
and chemical reaction hazards. For
further information on all our products
JCI Chilworth is our brand name for
a well established range of electro-static instruments, of which three are
mentioned below:
The JCI178 measures small quantities
of charge and charge transfer in
electrostatic discharges
The JCI140 Static Monitor is a hand-held proximity voltmeter used in many
industries and by electrostatic
professionals.
The JCI131 is an electric field meter
suitable for use in adverse conditions,
including long-term monitoring
outdoors.
We also offer a range of optional ac-cessories, consultancy and calibration
services which enhance and expand
this most comprehensive and excep-tional range of quality instrumentation.
JCI155v6 性能(néng)優(yōu)點
JCI-155v6靜(jìng)電分析儀是IEC 61340-2-1規(guī)範所(suǒ)采用(yòng)的(dí)*設(shè)備
JCI-155v6靜電分析(xī)儀式是(shì)美(měi)國國家(jiā)航空和(hé)宇宙航行(háng)局(NASA)采用(yòng)產(chǎn)品
JCI-155v6是一款(kuǎn)小(xiǎo)巧輕便的(dí)測試儀器(qì),采用電暈放電(diàn)方式(shì)施加(jiā)電荷到被測材料表麵,可以快速,精(jīng)確地測量(liáng)材(cái)料的(dí)靜電消(xiāo)散(sàn)能力和(hé)評(píng)估(gū)一(yī)定(dìng)數(shù)量(liáng)的(dí)電荷(hé)轉移到材(cái)料上時,是(shì)否(fǒu)會產生(shēng)明顯的(dí)靜(jìng)電(diàn)位。
JCI-155v6主要(yào)由電(diàn)壓計,電暈放電裝置(zhì),計時器,機(jī)械運(yùn)動結構,內(nèi)部處理器和(hé)儲(chǔ)存器構成。高壓電暈放(fàng)電(diàn)施(shī)加(jiā)電荷到(dào)測(cè)試料(liào)樣(yàng)表麵,電壓計(jì)對表麵電壓進(jìn)行測量,計時器(qì)對過(guò)程計時(shí),所有過(guò)程由內部處(chǔ)理器控製及處(chǔ)理(lǐ)數據(jù)。
所有(yǒu)的操(cāo)作和數(shù)據(jù)處(chǔ)理都由(yóu)JCI-155v6的(dí)處理器和軟件(jiàn)完(wán)成(chéng),通過(guò)5個多(duō)功能(néng)按(àn)鍵來進行人機(jī)交(jiāo)互(hù)。測試測試數據保存(cún)在儀(yí)器內(nèi)存(cún)中,可以(yǐ)通過USB接口輸出(chū)到(dào)個人電腦。
儀器(qì)本(běn)身大屏(píng)幕LCD可以(yǐ)顯示(shì)測(cè)試(shì)讀數(shù)和曲(qū)綫(xiàn)圖。采用(yòng)USB連接綫(xiàn)連接(jiē)個人(rén)電腦(nǎo)後(hòu),通過(guò)配套JCI-Graph軟件可以在電腦端控製(zhì)儀器,設置(zhì)測試(shì)參數。所(suǒ)有數(shù)據可以(yǐ)輸出(chū)到(dào)電腦並(bìng)保(bǎo)存(cún)為(wéi)表單(dān)文(wén)件(jiàn),測試數(shù)據和(hé)圖形可以(yǐ)直接(jiē)打印,復製(zhì)粘貼到(dào)其他(tā)應用程(chéng)序(例(lì)如WORD)。
配(pèi)套(tào)JCI-176樣品(pǐn)台提(tí)供一個標準的測試平台,可(kě)以方便地(dì)固(gù)定(dìng)被測(cè)材(cái)料。JCI-176還可以測(cè)試(shì)材料所(suǒ)獲得的電荷量(liáng),進(jìn)而(ér)計算電容負(fù)載。在JCI-176樣品台的基礎上(shàng)加上(shàng)JCI-173樣(yàng)品(pǐn)杯可以(yǐ)測試(shì)粉體和(hé)液(yè)體(tǐ)。
JCI-155v6采用(yòng)特(tè)殊(shū)結構(gòu),不(bù)同於傳(chuán)統(tǒng)的(dí)靜(jìng)電(diàn)衰減監測儀。傳統的(dí)靜電(diàn)衰(shuāi)減監(jiān)測(cè)儀(yí)要(yào)求把被測(cè)試材料(liào)按規(guī)定(dìng)尺(chǐ)寸切割後放(fàng)置(zhì)在一(yī)個(gè)旋轉的(dí)接地(dì)平台(tái)上(shàng),被測(cè)試材料(liào)周(zhōu)期性(xìng)的經過,電(diàn)壓探(tàn)頭下(xià)方,以此(cǐ)來(lái)周(zhōu)期性的獲取信號來(lái)計(jì)算衰(shuāi)減特(tè)性。
JCI-155v6采(cǎi)用旋(xuán)轉葉片式電壓(yā)探(tàn)頭,這(zhè)樣可(kě)以直接(jiē)周(zhōu)期性(xìng)的獲取(qǔ)信號,被測試料樣不用(yòng)特殊(shū)處理(lǐ),也不(bù)需要(yào)運(yùn)動(dòng)。因此(cǐ)JCI-155v6的整體結構(gòu)更(gēng)加緊密輕(qīng)巧,可(kě)以(yǐ)直接放置在被測材料上(shàng)進行測試。